Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration.
Theory[edit]
FCE has been shown to be reversible, demonstrating the fact that the electrons are moving rather than thermomigration or sublimation. The migration occurs due to the electronic wind force experienced by the metallic adatom.[1] The electromigration occurs at a critical power dissipation in the neck of the bridge.[2] This leads to Electromigrated Nanogaps.
Uses[edit]
FCE is often used in forming nanogaps in metallic bridges.
Problems[edit]
Thermal runaway can occur when the neck is narrower than about 20 nm.[3]
References and external links[edit]
- ^ H.Ishida (September 2000). "Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111)". Journal of Applied Physics. 89 (9): 4809–4814. Bibcode:2001JAP....89.4809R. doi:10.1063/1.1325385.
- ^ D.R. Strachan; et al. (2006). "Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy". Nano Letters. 6 (3): 441–444. Bibcode:2006NanoL...6..441S. doi:10.1021/nl052302a. PMID 16522038.
- ^ M.Mahadevan and R.m. Bradley (1999). "Simulations and theory of electromigration-induced slit formation in unpassivated single-crystal metal lines". Physical Review B. 59 (16): 11037–11046. Bibcode:1999PhRvB..5911037M. doi:10.1103/PhysRevB.59.11037.